
Transmission Electron Microscopy: Physics of Image Formation and Microanalysis
Synopsis
This stuy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of the particle-and wave-optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also analyzed are the kinematic and dynamical theories of electron diffraction and their applications for crystal-structure determination and the imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. This third edition includes a brief discussion of Schottky emission guns, some clarification of minor details, and references to the recent literature.
Publisher information
- Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
- ISBN: 9783540568490
- Number of pages: 545
- Dimensions: 235 x 155 mm
- Weight: 845g
- Languages: English












