Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings
Xiao Bai (editor), Edwin R. Hancock (editor), Tin Kam Ho (editor), Richard C. Wilson (editor), Battista Biggio (editor), Antonio Robles-Kelly (editor)
Paperback Published on: 02/08/2018
Price: £44.99
Publisher information
- Publisher: Springer International Publishing AG
- ISBN: 9783319977843
- Number of pages: 524
- Dimensions: 235 x 155 mm
- Languages: English


















