Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, SSPR & SPR 2010, Cesme, Izmir, Turkey, August 18-20, 2010. Proceedings
Edwin R. Hancock (editor), Richard C Wilson (editor), Terry Windeatt (editor), Ilkay Ulusoy (editor), Francisco Escolano (editor)
Paperback Published on: 30/07/2010
Price: £89.99
Publisher information
- Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
- ISBN: 9783642149795
- Number of pages: 758
- Languages: English


















