Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents

The book discusses the analysis and manipulation of processes on the atomic scale by forces and currents and gives a broad overview from a common perspective on the different fields of Scanning Probe Microscopy (SPM). Such a combined treatment is suggested theoretically, because both are just different aspects of physical and chemical processes at atomic interfaces. Forces do play an important role in Scanning Tunneling Microscopy (STM), and currents are an important issue in Atomic Force Microscopy (AFM). Experimentally, the existence of instruments for combined force/current measurements make the same point. This unique overview fills the gap in the litterature. USP: -Unique treatment of both Atomic Force Microscopy and Scanning Tunneling Microscopy -Written by leading experts -Gives a broad overview both from theory and experiments