Pattern Recognition and Machine Learning

Pattern Recognition and Machine Learning: Proceedings of the Japan—U.S. Seminar on the Learning Process in Control Systems, held in Nagoya, Japan August 18–20, 1970

Paperback Published on: 12/12/2012
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Publisher information

  • Publisher: Springer-Verlag New York Inc.
  • ISBN: 9781461575689
  • Number of pages: 344
  • Dimensions: 254 x 178 mm
  • Languages: English

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