Microelectronic Failure Analysis Desk Reference

Provides new or expanded coverage on the latest techniques for microelectronic failure analysis. The CD-ROM includes the complete content of the book in fully searchable Adobe Acrobat format. Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee. Contents: Submicron Defect Analysis Failure Analysis of Microelectromechanical Systems (MEMS) Leading Edge Circuit Board Fault Localization/Failure Analysis Failure Analysis of Passive Components/Hybrid Components List of Microelectronic Failure Analysis Acronyms (updated) Key Word Index to ISTFA proceedings and to the Microelectronic Failure Analysis Desk Reference, 4th Edition (updated).