Infrared Ellipsometry on Semiconductor Layer Structures

Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons

Hardback Published on: 26/11/2004
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Publisher information

  • Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
  • ISBN: 9783540232490
  • Number of pages: 196
  • Dimensions: 232 x 155 mm
  • Languages: English

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