
Gettering and Defect Engineering in Semiconductor Technology XVI
Synopsis
Collection of selected, peer reviewed papers from the
GADEST 2015: Gettering and Defect Engineering in Semiconductor Technology, September 20-25, 2015, Bad Staffelstein, Germany.
The 7
1
papers are grouped as follows:
Chapter 1: Growth of Mono- and Multi-Crystalline Silicon;
Chapter 2: Passivation and Defect Studies in Solar Cells;
Chapter 3: Intrinsic Point Defects and Dislocations in Silicon;
Chapter 4: Light Elements in Silicon-Based Materials;
Chapter 5: Properties and Gettering of Transition Metals in Silicon;
Chapter 6: Radiation- and Impurity-Related Defect Studies in Silicon and Germanium;
Chapter 7: Thermal Properties of Semiconductors;
Chapter 8: Luminescence and Optical Properties of Semiconductors; Chapter 9: Nano-Sized Layers and Structures; Chapter 10: Wide-Bandgap Semiconductors; Chapter 11: Advanced Methods and Tools for Investigation of Semiconductor Materials
Publisher information
- Publisher: Trans Tech Publications Ltd
- ISBN: 9783038356080
- Number of pages: 500
- Dimensions: 240 x 170 x 25 mm
- Weight: 990g
- Languages: English
















