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Gettering and Defect Engineering in Semiconductor Technology XI

Bernard Pichaud (editor), A. Claverie (editor), Daniel Alquier (editor), Hans Richter (editor), Martin Kittler (editor)

Paperback Published on: 01/10/2005

£315

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Synopsis

Volume is indexed by Thomson Reuters CPCI-S (WoS).
This proceedings volume contains 126 contributions from the 11th international meeting on Gettering and Defect Engineering in Semiconductor Technology GADEST 2005 held at “La Badine” at the Giens peninsula south of France.