Electromigration Inside Logic Cells

Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS

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Hardback Published on: 16/12/2016
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Publisher information

  • Publisher: Springer International Publishing AG
  • ISBN: 9783319488981
  • Number of pages: 118
  • Dimensions: 235 x 155 mm
  • Languages: English

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