
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Alberto Bosio (author), Luigi Dilillo (author), Patrick Girard (author), Serge Pravossoudovitch (author), Arnaud Virazel (author)
Paperback Published on: 03/09/2014
Price: £74.99
Publisher information
- Publisher: Springer-Verlag New York Inc.
- ISBN: 9781489983145
- Number of pages: 171
- Dimensions: 235 x 155 mm
- Languages: English
