Advanced Test Methods for SRAMs

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

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Hardback Published on: 04/11/2009
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Publisher information

  • Publisher: Springer-Verlag New York Inc.
  • ISBN: 9781441909374
  • Number of pages: 171
  • Dimensions: 235 x 155 mm
  • Languages: English

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