Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings
Antonio Robles-Kelly (editor), Marco Loog (editor), Battista Biggio (editor), Francisco Escolano (editor), Richard Wilson (editor)
Paperback Published on: 05/11/2016
Price: £44.99
Publisher information
- Publisher: Springer International Publishing AG
- ISBN: 9783319490540
- Number of pages: 588
- Dimensions: 235 x 155 mm
- Languages: English


















